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TC74ACT257P/F/FN
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC74ACT257P,TC74ACT257F,TC74ACT257FN
2-Channel Multiplexer (3-state)
Note: xxxFN (JEDEC SOP) is not available in Japan.
The TC74ACT257 is an advanced high speed CMOS MULTIPLEXER fabricated with silicon gate and double-layer metal wiring C2MOS technology. It achieve the high speed operation similar to equivalent Bipolar Schottky TTL while maintaining the CMOS low power dissipation. This device may be used as a level converter for interfacing TTL or NMOS to High Speed CMOS. The inputs are compatible with TTL or NMOS and CMOS output voltage levels. Each is composed of four independent 2-channel multiplexers with common SELECT and OUTPUT ENABLE ( OE ). If OE is set low, the outputs are held in a high-impedance state. When SELECT is set low, "A" data inputs are enabled. Conversely, when SELECT is high, "B" data inputs are enabled. All inputs are equipped with protection circuits against static discharge or transient excess voltage.
TC74ACT257P
TC74ACT257F
Features
* * * * High speed: tpd = 5.8 ns (typ.) at VCC = 5 V Low power dissipation: ICC = 8 A (max) at Ta = 25C Compatible with TTL outputs: VIL = 0.8 V (max) VIH = 2.0 V (min) Symmetrical output impedance: |IOH| = IOL = 24 mA (min) Capability of driving 50 * * transmission lines. Balanced propagation delays: tpLH - tpHL Pin and function compatible with 74F257 Weight DIP16-P-300-2.54A SOP16-P-300-1.27A SOL16-P-150-1.27 : 1.00 g (typ.) : 0.18 g (typ.) : 0.13 g (typ.)
TC74ACT257FN
Pin Assignment
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TC74ACT257P/F/FN
IEC Logic Symbol
Truth Table
Inputs
OE
Output A X L H X X B X X X L H Y Z L H L H
SELECT X L L H H
H L L L L
X: Don't care Z: High impedance
System Diagram
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Absolute Maximum Ratings (Note 1)
Characteristics Supply voltage range DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature Symbol VCC VIN VOUT IIK IOK IOUT ICC PD Tstg Rating -0.5 to 7.0 -0.5 to VCC + 0.5 -0.5 to VCC + 0.5 20 50 50 100 500 (DIP) (Note 2)/180 (SOP) -65 to 150 Unit V V V mA mA mA mA mW C
Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = -40 to 65C. From Ta = 65 to 85C a derating factor of -10 mW/C should be applied up to 300 mW.
Operating Ranges (Note)
Characteristics Supply voltage Input voltage Output voltage Operating temperature Input rise and fall time Symbol VCC VIN VOUT Topr dt/dV Rating 4.5 to 5.5 0 to VCC 0 to VCC -40 to 85 0 to 10 Unit V V V C ns/V
Note:
The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND.
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Electrical Characteristics
DC Characteristics
Test Condition Characteristics Symbol VCC (V) IOH = -50 A VIN = VIH or IOH = -24 mA VIL IOH = -75 mA VIN = VIH or IOL = 24 mA VIL IOL = 75 mA VIN = VIH or VIL VOUT = VCC or GND VIN = VCC or GND VIN = VCC or GND Per input: VIN = 3.4 V Other input: VCC or GND IOL = 50 A 4.5 to 5.5 4.5 to 5.5 4.5 4.5 (Note) 5.5 4.5 4.5 (Note) 5.5 5.5 5.5 5.5 5.5 Min 2.0 4.4 3.94 Ta = 25C Typ. 4.5 0.0 Max 0.8 0.1 0.36 0.5 0.1 8.0 1.35 Ta = -40 to 85C Min 2.0 4.4 3.80 3.85 Max 0.8 0.1 0.44 1.65 5.0 1.0 80.0 1.5 A A A mA V V V V Unit
High-level input voltage Low-level input voltage High-level output voltage
VIH VIL
VOH
Low-level output voltage
VOL
3-state output off-state current Input leakage current Quiescent supply current
IOZ IIN ICC IC
Note:
This spec indicates the capability of driving 50 transmission lines. One output should be tested at a time for a 10 ms maximum duration.
AC Characteristics (CL = 50 pF, RL = 500 , input: tr = tf = 3 ns)
Characteristics Propagation delay time (A, B-Y) Propagation delay time (SELECT-Y) Output enable time Symbol Test Condition VCC (V) tpLH tpHL tpLH tpHL tpZL tpZH tpLZ tpHZ CIN COUT CPD (Note) 5.0 0.5 Min Ta = 25C Typ. 6.5 Max 9.6 Ta = -40 to 85C Min 1.0 Max 11.0 ns Unit
5.0 0.5
7.8
11.4
1.0
13.0
ns
5.0 0.5
6.3
9.6
1.0
11.0
ns
Output disable time Input capacitance Output capacitance Power dissipation capacitance

5.0 0.5

6.3 5 10 57
8.8 10
1.0
10.0 10
ns pF pF pF
Note:
CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPDVCCfIN + ICC/4 (per bit)
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Package Dimensions
Weight: 1.00 g (typ.)
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Package Dimensions
Weight: 0.18 g (typ.)
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Package Dimensions (Note)
Note: This package is not available in Japan. Weight: 0.13 g (typ.)
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RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN GENERAL
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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